PSL DF-3 / PSL DF-3 LT
Measuring Device
Processor controlled bus bar resistance test of a cell Dark Forward Characteristic measurement (PSL DF only)
The PSL DF-3 / PSL DF-3 LT is optimized for fully automated production lines. It records the resistance between the bus bars of a cell and records the Dark Forward curve.
It also is usable as power source for fast EL test by InGaAs imagers.